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O‘zbekcha

FTIR ANALYSIS OF SILICON AND OXIDE SILICON THIN FILMS

Mualliflar

  • Muradulla Normuradov

    Doctor of Physical and Mathematical Sciences, Professor, Karshi State University

  • Kuvondik Dovranov

    Karshi State Universit

  • Khuzhamkul Davranov

    Karshi State University

  • Muzaffar Davlatov

    Karshi State University

Kalit so‘zlar:

silicon oxide, FT-IR spectrometer, thin films, absorption spectra, transmission spectra, “ion-plasma” method, refraction index, ATR spectrum

Annotatsiya

FT-IR spectrometers are used to solve various problems of modern analytics. Designed for qualitative analysis, checking the refractive index of thin films, the thickness of thin films. We studied the mid-infrared transmission and absorption spectra, refractive index, layer thickness, standard deviation, incident angle, average interference fringes, and the coupling between silicon and oxygen of thin films obtained by the ion-plasma method.

Mualliflar haqida

  • Kuvondik Dovranov , Karshi State Universit

    PhD student, Karshi State Universit

  • Khuzhamkul Davranov , Karshi State University

    PhD student, Karshi State University

  • Muzaffar Davlatov , Karshi State University

    PhD student, Karshi State University

Adabiyotlar

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Normuradov M.T., Dovranov K.T., Davranov Kh.T., Davlatov M. “Prospects of development of the physics of condensed matter” International scientific and scientific-technical conference materials. October 4-15.pp.113-115 2022.

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Francesco Boschetto, Nami Toyama, Satoshi Horiguchi, M. Ryan Bock, J. Bryan McEntire, Tetsuya Adachi, Elia Marin, Wenliang Zhu, B. Osam Mazda. Sonny Balde and Giuseppe Pezzotti. II.Fourier transform infrared spectroscopy. Analyst. 2018,143, 2128-2140.

https://doi.org/10.1039/C8AN00234G

Gun’ko V.M., Pakhlov E.M., Skubiszewska-Zięba J., Blitz J.P. Vibrational Spectroscopy. Vol. 88, January 2017, Pag, 56-62. https://doi.org/10.1016/j.vibspec.2016.11.003

Yuklab olishlar

Nashr etilgan

2023-11-28

Son

№ 4 (2023): FarDU ilmiy xabarlari jurnali (Aniq va tabiy fanlar)

Bo‘lim

Physics and technology

Litsenziya

Mualliflik huquqi (c) 2023 Scientific journal of the Fergana State University

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